[Fwd: LF: FETs failing]

[Andre Kesteloot]

Alan Melia wrote:

> Hi All, Jim has raised an interesting point about low current testing which
> probably applies to BJT RF devices as well in some cases. A lot of these
> devices consist of several small fets (or smaller BJTs) in parallel on the
> chip. It is possible to have some of these go open (BJTs suffer breaks in
> their emitter metallisation due to electro-migration of the contact metal)
> Breaks in source, or emitter, paralleling track on the chip could mean that
> the unit could look ok at low currents, but be overloaded when run at full
> blast.
>
> Cheers de Alan G3NYK
> alan.melia@btinternet.com